Sachan, Rajeev Kumar, et al. “Temperature Sensitivity Assessment of Nonlinear Channel Tunnel Field-Effect Transistor for Raised Efficiency and Reliability in Nanoscale Electronics”. International Research Journal of Multidisciplinary Technovation, vol. 7, no. 2, Mar. 2025, pp. 261-76, https://doi.org/10.54392/irjmt25218.