SACHAN, Rajeev Kumar; VEDVRAT; BAJPAI, Shrish. Temperature Sensitivity Assessment of Nonlinear Channel Tunnel Field-Effect Transistor for Raised Efficiency and Reliability in Nanoscale Electronics. International Research Journal of Multidisciplinary Technovation, [S. l.], v. 7, n. 2, p. 261–276, 2025. DOI: 10.54392/irjmt25218. Disponível em: https://asianrepo.org/index.php/irjmt/article/view/135.. Acesso em: 11 sep. 2025.